-- Upcoming Events
-- White Papers
-- Careers
-- Brochures

COMPANY | Testimonials

Customer Testimonials:

*Solidus dynamic testing virtually eliminated our customer returns.

*Director of Quality requires all our MEMS sensors to go through Solidus Testers.

*Package test yields have gone from 85% to 99%+.

*Wafer Fab Manager insisted on Solidus system in the FAB as a quality gate.

*Design Engineer: “The data from the Solidus test system is the only tester data I have ever seen which match my gyro simulations”.

*After using the Solidus testers for more than a year we have decided to send all our MEMS product through the test systems. 

*The systems improve our quality and we find more product defects and it helps keeping our fabrication processes in control.

*The wafer level testing with the solidus systems was key in fixing our gyro designs before product launch.

*Wafer sorting by performance of our MEMS devices was key to achieving our  goal of no physical stimulus at final package test.

For more information, contact your Solidus Technologies, Inc. Representative 

Copyright 2008 Solidus Technologies, Inc. | ColoradoGermanyKoreaJapanFrance | MEMS Sensor Test Equipment & Semiconductors
3333 North El Paso Street, Suite E | Colorado Springs, CO 80907-5478, USA | Tel: +1.719.471.1960